"Instrumentation effects on the detection of resistance transients during ..."

Craig C. F. Fahrenkrug, Linda M. Head (2000)

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DOI: 10.1109/19.863912

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type: Journal Article

metadata version: 2020-06-08

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Craig C. F. Fahrenkrug, Linda M. Head:
Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects. IEEE Trans. Instrum. Meas. 49(4): 716-720 (2000)

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