"Multiband Permittivity Measurement of Metallized-Bulk Substrate With ..."

Hongyu Du et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TIM.2024.3384557

access: closed

type: Journal Article

metadata version: 2024-05-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/DuWMFTTR24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/DuWMFTTR24
Hongyu Du, Fayu Wan, Nour Mohammad Murad, Glauco Fontgalland, Preeti Thakur, Atul Thakur, Blaise Ravelo:
Multiband Permittivity Measurement of Metallized-Bulk Substrate With Negative Group Delay-Based Ring Resonator. IEEE Trans. Instrum. Meas. 73: 1-15 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.