"High-Temperature RF Material Characterization Using a Dual-Chambered ..."

Andrew E. Bogle et al. (2017)

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DOI: 10.1109/TIM.2017.2700918

access: closed

type: Journal Article

metadata version: 2020-06-08

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Andrew E. Bogle, Milo W. Hyde, Michael J. Havrilla, Jeffrey S. Sovern:
High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture. IEEE Trans. Instrum. Meas. 66(9): 2422-2427 (2017)

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