"A novel system for systematic microwave noise and DC characterization of ..."

Stephan Biber et al. (2004)

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DOI: 10.1109/TIM.2003.820487

access: closed

type: Journal Article

metadata version: 2020-06-08

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Stephan Biber, Oleg Cojocari, Günther Rehm, Bastian Mottet, Manuel Rodríguez-Gironés, Lorenz-Peter Schmidt, Hans L. Hartnagel:
A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. IEEE Trans. Instrum. Meas. 53(2): 581-587 (2004)

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