"Identification of MOSFET Working State Based on the Stress Wave and Deep ..."

Yun Bai et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TIM.2022.3165276

access: closed

type: Journal Article

metadata version: 2023-03-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/BaiLHCLG22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/BaiLHCLG22
Yun Bai, Songyuan Liu, Yunze He, Liang Cheng, Fei Liu, Xuefeng Geng:
Identification of MOSFET Working State Based on the Stress Wave and Deep Learning. IEEE Trans. Instrum. Meas. 71: 1-9 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.