"Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative ..."

Jongsun Bae, Sanghyeon Baeg, Sungju Park (2012)

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DOI: 10.1109/TIM.2012.2211472

access: closed

type: Journal Article

metadata version: 2020-06-08

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Jongsun Bae, Sanghyeon Baeg, Sungju Park:
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. IEEE Trans. Instrum. Meas. 61(12): 3259-3272 (2012)

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