"A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC."

Sanghyun Ahn et al. (2009)

> Home

Details and statistics

DOI: 10.1109/TIM.2008.2009416

access: closed

type: Journal Article

metadata version: 2020-06-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/AhnPPKP09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/AhnPPKP09
Sanghyun Ahn, Zachary D. Patitz, Noh-Jin Park, Hyoung Joong Kim, Nohpill Park:
A Floorprint-Based Defect Tolerance for Nano-Scale Application-Specific IC. IEEE Trans. Instrum. Meas. 58(5): 1283-1290 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.