"A Feature-Based Solution to Forward Problem in Electrical Capacitance ..."

Mohamed A. Abdelrahman, Ankush Gupta, Wael A. Deabes (2011)

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DOI: 10.1109/TIM.2010.2049224

access: closed

type: Journal Article

metadata version: 2020-06-08

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Mohamed A. Abdelrahman, Ankush Gupta, Wael A. Deabes:
A Feature-Based Solution to Forward Problem in Electrical Capacitance Tomography of Conductive Materials. IEEE Trans. Instrum. Meas. 60(2): 430-441 (2011)

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