"Microcrack Defect Quantification Using a Focusing High-Order SH Guided ..."

Hongyu Sun et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TII.2021.3105537

access: closed

type: Journal Article

metadata version: 2022-02-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tii/SunPLWZH22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tii/SunPLWZH22
Hongyu Sun, Lisha Peng, Junming Lin, Shen Wang, Wei Zhao, Songling Huang:
Microcrack Defect Quantification Using a Focusing High-Order SH Guided Wave EMAT: The Physics-Informed Deep Neural Network GuwNet. IEEE Trans. Ind. Informatics 18(5): 3235-3247 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.