"Attention-Guided Multitask Learning for Surface Defect Identification."

Vignesh Sampath et al. (2023)

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DOI: 10.1109/TII.2023.3234030

access: open

type: Journal Article

metadata version: 2023-09-12

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Vignesh Sampath, Iñaki Maurtua, Juan José Aguilar Martín, Andoni Rivera, Jorge Molina, Aitor Gutierrez:
Attention-Guided Multitask Learning for Surface Defect Identification. IEEE Trans. Ind. Informatics 19(9): 9713-9721 (2023)

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