"Cascaded Approach to Defect Location and Classification in Microelectronic ..."

Zhili Long, Xing Zhou, Xiaojun Wu (2020)

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DOI: 10.1109/TII.2019.2950496

access: closed

type: Journal Article

metadata version: 2022-06-16

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Zhili Long, Xing Zhou, Xiaojun Wu:
Cascaded Approach to Defect Location and Classification in Microelectronic Bonded Joints: Improved Level Set and Random Forest. IEEE Trans. Ind. Informatics 16(7): 4403-4412 (2020)

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