"Weakly Supervised End-to-End Learning for Inspection on Multidirectional ..."

Zhongshu Chen et al. (2024)

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DOI: 10.1109/TII.2023.3301065

access: closed

type: Journal Article

metadata version: 2024-03-16

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Zhongshu Chen, Lin Zuo, Feng Guo, Changhua Zhang, Yu Liu:
Weakly Supervised End-to-End Learning for Inspection on Multidirectional Integrated Circuit Markings in Surface Mount Technology. IEEE Trans. Ind. Informatics 20(3): 3133-3143 (2024)

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