"Fault Prediction via Symptom Pattern Extraction Using the Discretized ..."

Sujeong Baek, Duck Young Kim (2019)

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DOI: 10.1109/TII.2018.2828856

access: closed

type: Journal Article

metadata version: 2020-05-21

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Sujeong Baek, Duck Young Kim:
Fault Prediction via Symptom Pattern Extraction Using the Discretized State Vectors of Multisensor Signals. IEEE Trans. Ind. Informatics 15(2): 922-931 (2019)

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