"Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks."

Chris G. Zeinstra, Raymond N. J. Veldhuis, Luuk J. Spreeuwers (2018)

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DOI: 10.1109/TIFS.2017.2746013

access: closed

type: Journal Article

metadata version: 2024-08-04

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Chris G. Zeinstra, Raymond N. J. Veldhuis, Luuk J. Spreeuwers:
Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE Trans. Inf. Forensics Secur. 13(1): 253-264 (2018)

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