"Monitoring Device Current to Characterize Trim Operations of Solid-State ..."

James Shey et al. (2019)

> Home

Details and statistics

DOI: 10.1109/TIFS.2018.2876835

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tifs/SheyBWTNRF19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tifs/SheyBWTNRF19
James Shey, Justin A. Blanco, T. Owens Walker, Thomas W. Tedesso, Hau T. Ngo, Ryan N. Rakvic, Kevin D. Fairbanks:
Monitoring Device Current to Characterize Trim Operations of Solid-State Drives. IEEE Trans. Inf. Forensics Secur. 14(5): 1296-1306 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.