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"Torsional Harmonic Kelvin Probe Force Microscopy for High-Sensitivity ..."
Hao Zhang et al. (2022)
- Hao Zhang, Haibo Gao, Junyuan Geng, Xianghe Meng, Hui Xie:
Torsional Harmonic Kelvin Probe Force Microscopy for High-Sensitivity Mapping of Surface Potential. IEEE Trans. Ind. Electron. 69(2): 1654-1662 (2022)
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