"In Situ Insulated Gate Bipolar Transistor Junction Temperature Estimation ..."

Yanyong Yang, Pinjia Zhang (2021)

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DOI: 10.1109/TIE.2020.3022526

access: closed

type: Journal Article

metadata version: 2021-09-16

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Yanyong Yang, Pinjia Zhang:
In Situ Insulated Gate Bipolar Transistor Junction Temperature Estimation Method via a Bond Wire Degradation Independent Parameter Turn-OFF V_ce Overshoot. IEEE Trans. Ind. Electron. 68(10): 10118-10129 (2021)

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