"Full-Time Junction Temperature Extraction of IGCT Based on Electrothermal ..."

Chaoqun Xu et al. (2021)

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DOI: 10.1109/TIE.2019.2962423

access: closed

type: Journal Article

metadata version: 2022-11-11

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Chaoqun Xu, Biao Zhao, Xiangyu Zhang, Zhengyu Chen, Jiapeng Liu, Wenpeng Zhou, Zhanqing Yu, Rong Zeng:
Full-Time Junction Temperature Extraction of IGCT Based on Electrothermal Model and TSEP Method for High-Power Applications. IEEE Trans. Ind. Electron. 68(1): 47-58 (2021)

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