"Comprehensive Analysis and Experiments of RB-IGCT, IGCT With Fast Recovery ..."

Chaoqun Xu et al. (2023)

> Home

Details and statistics

DOI: 10.1109/TIE.2022.3158019

access: closed

type: Journal Article

metadata version: 2022-11-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/XuYCZWRZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/XuYCZWRZ23
Chaoqun Xu, Zhanqing Yu, Zhengyu Chen, Biao Zhao, Zongze Wang, Chunpin Ren, Rong Zeng:
Comprehensive Analysis and Experiments of RB-IGCT, IGCT With Fast Recovery Diode and Standard Recovery Diode in Hybrid Line-Commutated Converter for Commutation Failure Mitigation. IEEE Trans. Ind. Electron. 70(2): 1126-1139 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.