"Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge."

Kaihong Wang et al. (2023)

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DOI: 10.1109/TIE.2022.3190870

access: closed

type: Journal Article

metadata version: 2023-01-15

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Kaihong Wang, Pengju Sun, Binxin Zhu, Quanming Luo, Xiong Du:
Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge. IEEE Trans. Ind. Electron. 70(5): 5214-5223 (2023)

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