"Fast thermal profiling of power semiconductor devices using Fourier ..."

Jody J. Nelson, Giri Venkataramanan, Ayman M. El-Refaie (2006)

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DOI: 10.1109/TIE.2006.870714

access: closed

type: Journal Article

metadata version: 2022-10-02

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Jody J. Nelson, Giri Venkataramanan, Ayman M. El-Refaie:
Fast thermal profiling of power semiconductor devices using Fourier techniques. IEEE Trans. Ind. Electron. 53(2): 521-529 (2006)

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