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"Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters."

Simone Negri et al. (2024)

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DOI: 10.1109/TIE.2024.3357888

access: closed

type: Journal Article

metadata version: 2024-08-02

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Simone Negri, Giordano Spadacini, Flavia Grassi, Sergio Amedeo Pignari:
Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters. IEEE Trans. Ind. Electron. 71(10): 13351-13360 (2024)

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