"Improvement and Dynamic Simulation Test of the Power Electronic Device ..."

Yifan Li et al. (2022)

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DOI: 10.1109/TIE.2021.3066930

access: closed

type: Journal Article

metadata version: 2023-08-04

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Yifan Li, Shaofeng Huang, Hui Li, Jingwen Li, Haifeng Wu:
Improvement and Dynamic Simulation Test of the Power Electronic Device Applied to Phase Sequence Exchange Technology. IEEE Trans. Ind. Electron. 69(3): 3193-3202 (2022)

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