"Time-Varying Cumulative Damage Recursive Method for Power Semiconductor ..."

Wei Lai et al. (2023)

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DOI: 10.1109/TIE.2023.3236118

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type: Journal Article

metadata version: 2023-07-07

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Wei Lai, Hanrui Li, Hui Li, Minyou Chen, Ran Yao, Hongjian Xia, Renkuai Liu, Anbin Liu:
Time-Varying Cumulative Damage Recursive Method for Power Semiconductor Devices. IEEE Trans. Ind. Electron. 70(12): 12795-12805 (2023)

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