"A High-Quality Ratio-Metric Measurement Method Based on Analog-to-Digital ..."

Mengmeng Kong et al. (2024)

Details and statistics

DOI: 10.1109/TIE.2023.3342278

access: closed

type: Journal Article

metadata version: 2024-06-18

a service of  Schloss Dagstuhl - Leibniz Center for Informatics