"A Prognostic Model Based on DBN and Diffusion Process for Degrading Bearing."

Chang-Hua Hu et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TIE.2019.2947839

access: closed

type: Journal Article

metadata version: 2020-08-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/HuPSDPW20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/HuPSDPW20
Chang-Hua Hu, Hong Pei, Xiao-Sheng Si, Dang-Bo Du, Zhenan Pang, Xi Wang:
A Prognostic Model Based on DBN and Diffusion Process for Degrading Bearing. IEEE Trans. Ind. Electron. 67(10): 8767-8777 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.