"Reliability Considerations for Parallel Performance of Semiconductor ..."

Babak Abdi et al. (2009)

> Home

Details and statistics

DOI: 10.1109/TIE.2009.2014306

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/AbdiRGM09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/AbdiRGM09
Babak Abdi, Amir Hossein Ranjbar, Gevorg B. Gharehpetian, Jafar Milimonfared:
Reliability Considerations for Parallel Performance of Semiconductor Switches in High-Power Switching Power Supplies. IEEE Trans. Ind. Electron. 56(6): 2133-2139 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.