"Measuring Multiresolution Surface Roughness Using V-System."

Wei Cao, Zhanchuan Cai, Ben Ye (2018)

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DOI: 10.1109/TGRS.2017.2764519

access: closed

type: Journal Article

metadata version: 2022-02-07

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Wei Cao, Zhanchuan Cai, Ben Ye:
Measuring Multiresolution Surface Roughness Using V-System. IEEE Trans. Geosci. Remote. Sens. 56(3): 1497-1506 (2018)

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