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"A Large Scale Characterization of Device Uptimes."

Mateus Schulz Nogueira et al. (2023)

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DOI: 10.1109/TETC.2023.3271315

access: closed

type: Journal Article

metadata version: 2023-10-14

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  - https://dblp.org/rec/journals/tetc/NogueiraFBAUNMXRW23
Mateus Schulz Nogueira, Erica da Cunha Ferreira, Pedro Tubenchlak Boechat, Felipe Assis, Estevão Rabello Ussler, Rafael Rodrigo Furtado do Nascimento, Daniel Sadoc Menasché, Geraldo Xexéo, Abhishek Ramchandran, Katinka Wolter:
A Large Scale Characterization of Device Uptimes. IEEE Trans. Emerg. Top. Comput. 11(3): 553-565 (2023)

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