"A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation ..."

Takaaki Kato et al. (2020)

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DOI: 10.1109/TETC.2017.2767070

access: closed

type: Journal Article

metadata version: 2020-09-19

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Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara, Xiaoqing Wen:
A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips. IEEE Trans. Emerg. Top. Comput. 8(3): 591-601 (2020)

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