"A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability ..."

Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji (2021)

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DOI: 10.1109/TETC.2020.2987946

access: closed

type: Journal Article

metadata version: 2021-06-15

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Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji:
A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability Optimization of Integrated Circuits. IEEE Trans. Emerg. Top. Comput. 9(2): 759-773 (2021)

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