"In-Field Recovery of RF Circuits from Wearout Based Performance Degradation."

Doohwang Chang et al. (2020)

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DOI: 10.1109/TETC.2017.2737320

access: closed

type: Journal Article

metadata version: 2020-07-15

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Doohwang Chang, Jennifer N. Kitchen, Sayfe Kiaei, Sule Ozev:
In-Field Recovery of RF Circuits from Wearout Based Performance Degradation. IEEE Trans. Emerg. Top. Comput. 8(2): 442-452 (2020)

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