"Crisis-Critical Intellectual Property: Findings From the COVID-19 Pandemic."

Frank Tietze et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TEM.2020.2996982

access: open

type: Journal Article

metadata version: 2023-07-27

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/tem/TietzeVAM22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tem/TietzeVAM22
Frank Tietze, Pratheeba Vimalnath, Leonidas Aristodemou, Jenny Molloy:
Crisis-Critical Intellectual Property: Findings From the COVID-19 Pandemic. IEEE Trans. Engineering Management 69(5): 2039-2056 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.