"Investigating the Knowledge Spillover and Externality of Technology ..."

Pei-Chun Lee (2021)

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DOI: 10.1109/TEM.2019.2911636

access: closed

type: Journal Article

metadata version: 2023-08-28

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Pei-Chun Lee:
Investigating the Knowledge Spillover and Externality of Technology Standards Based on Patent Data. IEEE Trans. Engineering Management 68(4): 1027-1041 (2021)

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