"A Random Onset Model for Degradation of High-Reliability Systems."

Scott A. Vander Wiel et al. (2011)

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DOI: 10.1198/TECH.2011.09119

access: closed

type: Journal Article

metadata version: 2019-10-19

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Scott A. Vander Wiel, Alyson G. Wilson, Todd L. Graves, C. Shane Reese:
A Random Onset Model for Degradation of High-Reliability Systems. Technometrics 53(2): 163-172 (2011)

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