"Reliability, Yield and Stress Burn-in: A Unified Approach for ..."

Francisco J. Samaniego (1999)

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DOI: 10.1080/00401706.1999.10485942

access: closed

type: Journal Article

metadata version: 2017-05-27

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Francisco J. Samaniego:
Reliability, Yield and Stress Burn-in: A Unified Approach for Microelectronics Systems Manufacturing and Software Development. Technometrics 41(4): 371-372 (1999)

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