"Accounting for Location Measurement Error in Imaging Data With Application ..."

Matthew J. Miller et al. (2022)

> Home

Details and statistics

DOI: 10.1080/00401706.2021.1905070

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/technometrics/MillerCDLR22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/technometrics/MillerCDLR22
Matthew J. Miller, Matthew J. Cabral, Elizabeth C. Dickey, James M. LeBeau, Brian J. Reich:
Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. Technometrics 64(1): 103-113 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.