"Measurement Models for Psychological Attributes: by Klaas Sijtsma, and ..."

Stan Lipovetsky (2022)

> Home

Details and statistics

DOI: 10.1080/00401706.2022.2087424

access: closed

type: Journal Article

metadata version: 2022-10-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/technometrics/Lipovetsky22i
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/technometrics/Lipovetsky22i
Stan Lipovetsky:
Measurement Models for Psychological Attributes: by Klaas Sijtsma, and Andries L. van der Ark, Boca Raton, FL, CRC Press, Taylor & Francis Group, Chapman and Hall, 2020, 428 pp., 50 b/w illustrations, $79.95 (pbk), ISBN 978-0-367-42452-7. Technometrics 64(3): 426-429 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.