"CRRC: Coordinating Retention Errors, Read Disturb Errors and Huffman ..."

Ta-Ching Yu, Chin-Hsien Wu, Yan-Qi Liao (2023)

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DOI: 10.1109/TDSC.2022.3177812

access: closed

type: Journal Article

metadata version: 2023-06-02

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Ta-Ching Yu, Chin-Hsien Wu, Yan-Qi Liao:
CRRC: Coordinating Retention Errors, Read Disturb Errors and Huffman Coding on TLC NAND Flash Memory. IEEE Trans. Dependable Secur. Comput. 20(3): 2208-2220 (2023)

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