"Modeling Soft Errors at the Device and Logic Levels for Combinational ..."

Rajaraman Ramanarayanan et al. (2009)

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DOI: 10.1109/TDSC.2007.70231

access: closed

type: Journal Article

metadata version: 2020-04-09

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Rajaraman Ramanarayanan, Vijay Degalahal, Krishnan Ramakrishnan, Jungsub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary Jane Irwin, Kenan Unlu:
Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits. IEEE Trans. Dependable Secur. Comput. 6(3): 202-216 (2009)

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