"Empirical Sensitivity Analysis of Discretization Parameters for Fault ..."

Sujeong Baek, Duck Young Kim (2017)

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DOI: 10.1109/TCYB.2016.2540657

access: closed

type: Journal Article

metadata version: 2020-05-22

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Sujeong Baek, Duck Young Kim:
Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data. IEEE Trans. Cybern. 47(5): 1198-1209 (2017)

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