"Likelihood-ratio-based biometric verification."

Asker M. Bazen, Raymond N. J. Veldhuis (2004)

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DOI: 10.1109/TCSVT.2003.818356

access: closed

type: Journal Article

metadata version: 2020-08-25

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Asker M. Bazen, Raymond N. J. Veldhuis:
Likelihood-ratio-based biometric verification. IEEE Trans. Circuits Syst. Video Technol. 14(1): 86-94 (2004)

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