"An improved model-based method to test circuit faults."

Xiaochun Cheng et al. (2005)

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DOI: 10.1016/J.TCS.2005.04.004

access: open

type: Journal Article

metadata version: 2024-02-20

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Xiaochun Cheng, Dantong Ouyang, Yunfei Jiang, Chengqi Zhang:
An improved model-based method to test circuit faults. Theor. Comput. Sci. 341(1-3): 150-161 (2005)

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