"Channel Models for Multi-Level Cell Flash Memories Based on Empirical ..."

Veeresh Taranalli, Hironori Uchikawa, Paul H. Siegel (2016)

> Home

Details and statistics

DOI: 10.1109/TCOMM.2016.2584602

access: closed

type: Journal Article

metadata version: 2020-09-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcom/TaranalliUS16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcom/TaranalliUS16
Veeresh Taranalli, Hironori Uchikawa, Paul H. Siegel:
Channel Models for Multi-Level Cell Flash Memories Based on Empirical Error Analysis. IEEE Trans. Commun. 64(8): 3169-3181 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.