"Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in ..."

Laavanya Rachakonda et al. (2019)

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DOI: 10.1109/TCE.2019.2940472

access: closed

type: Journal Article

metadata version: 2020-10-26

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Laavanya Rachakonda, Saraju P. Mohanty, Elias Kougianos, Prabha Sundaravadivel:
Stress-Lysis: A DNN-Integrated Edge Device for Stress Level Detection in the IoMT. IEEE Trans. Consumer Electron. 65(4): 474-483 (2019)

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