"Next-Generation Consumer Electronics Data Auditing Scheme Toward ..."

Yi Li et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TCE.2024.3368206

access: closed

type: Journal Article

metadata version: 2025-03-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tce/LiSVLSS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tce/LiSVLSS24
Yi Li, Jian Shen, Pandi Vijayakumar, Chin-Feng Lai, Audithan Sivaraman, Pradip Kumar Sharma:
Next-Generation Consumer Electronics Data Auditing Scheme Toward Cloud-Edge Distributed and Resilient Machine Learning. IEEE Trans. Consumer Electron. 70(1): 2244-2256 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.