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"Next-Generation Consumer Electronics Data Auditing Scheme Toward ..."
Yi Li et al. (2024)
- Yi Li, Jian Shen, Pandi Vijayakumar, Chin-Feng Lai, Audithan Sivaraman, Pradip Kumar Sharma
:
Next-Generation Consumer Electronics Data Auditing Scheme Toward Cloud-Edge Distributed and Resilient Machine Learning. IEEE Trans. Consumer Electron. 70(1): 2244-2256 (2024)
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