"Reducing excessive journaling overhead with small-sized NVRAM for mobile ..."

Junghoon Kim, Changwoo Min, Young Ik Eom (2014)

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DOI: 10.1109/TCE.2014.6851997

access: closed

type: Journal Article

metadata version: 2020-07-09

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Junghoon Kim, Changwoo Min, Young Ik Eom:
Reducing excessive journaling overhead with small-sized NVRAM for mobile devices. IEEE Trans. Consumer Electron. 60(2): 217-224 (2014)

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