"OFDM performance analysis in the phase noise arising from the hot-carrier ..."

Sameer R. Herlekar et al. (2006)

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DOI: 10.1109/TCE.2006.1706467

access: closed

type: Journal Article

metadata version: 2021-10-28

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Sameer R. Herlekar, Chi Zhang, Hsiao-Chun Wu, Ashok Srivastava, Yiyan Wu:
OFDM performance analysis in the phase noise arising from the hot-carrier effect. IEEE Trans. Consumer Electron. 52(3): 757-765 (2006)

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