"Proposal of a universal test scene for depth map evaluation."

Istvan Andorko, Peter M. Corcoran, Petronel Bigioi (2013)

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DOI: 10.1109/TCE.2013.6531121

access: closed

type: Journal Article

metadata version: 2020-07-09

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Istvan Andorko, Peter M. Corcoran, Petronel Bigioi:
Proposal of a universal test scene for depth map evaluation. IEEE Trans. Consumer Electron. 59(2) (2013)

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