"A Remaining Useful Life Prediction Method in the Early Stage of Stochastic ..."

Yuhan Zhang et al. (2021)

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DOI: 10.1109/TCSII.2020.3034393

access: closed

type: Journal Article

metadata version: 2021-06-15

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  - https://dblp.org/rec/journals/tcasII/ZhangYXLL21
Yuhan Zhang, Ying Yang, Xianchao Xiu, He Li, Ruijie Liu:
A Remaining Useful Life Prediction Method in the Early Stage of Stochastic Degradation Process. IEEE Trans. Circuits Syst. II Express Briefs 68(6): 2027-2031 (2021)

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